Sensing method and apparatus for resistance memory device

ABSTRACT

An MRAM memory integrated circuit is disclosed. Resistance, and hence logic state, is determined by discharging a first charged capacitor through an unknown cell resistive element to be sensed at a fixed voltage, and a pair of reference capacitors. The rate at which the parallel combination of capacitors discharge is between the discharge rate associated with a binary ‘1’ and ‘0’ value, and thus offers a reference for comparison.

CROSS REFERENCE TO RELATED APPLICATIONS

The present application is a continuation of U.S. application Ser. No. 10/422,849, filed on Apr. 25, 2003, now U.S. Pat. No. 6,741,490 which is a continuation of U.S. application Ser. No. 09/939,655, filed on Aug. 28, 2001 (now U.S. Pat. No. 6,577,525, issued on Jun. 10, 2003), the disclosures of which are each herewith incorporated by reference in their entirety.

FIELD OF THE INVENTION

The present invention relates to the field of resistor-based memory circuits. More particularly, it relates to a method for precisely sensing the resistance value of a resistor-based memory cell, for example, a Magnetic Random Access Memory (MRAM) magnetic memory cell.

BACKGROUND OF THE INVENTION

A resistor-based memory such as a magnetic random access memory (MRAM) typically includes an array of resistor-based magnetic memory cells. The logic state of such a magnetic memory cell is indicated by its resistance. One resistance value, e.g., the higher value, may be used to signify a logic high while another resistance value, e.g., the lower value, may be used to signify a logic low. The value stored in each memory cell can be determined by measuring the resistance value of the cell to determine whether the cell corresponds to a logic high or low. Such direct measurements are often difficult to simply and easily implement and require a number of comparators which increases the cost and size of the memory circuit. A simplified, more reliable method of sensing the resistance value of a resistor-based memory cell is desired.

SUMMARY OF THE INVENTION

The present invention provides a simple and reliable method and apparatus for sensing the logic state of a resistor-based memory cell. Resistance is measured by first charging a first capacitor to a predetermined voltage, discharging the first capacitor through a resistance to be measured while discharging a second capacitor through an associated reference resistance of known value and comparing the discharge characteristics e.g. the discharge voltage of two capacitors to determine a value of resistance to be measured relative to the reference resistance.

In one exemplary embodiment, a pair of second capacitors are used, each discharging through an associated reference resistance, one having a value corresponding to one possible resistance value of the resistance to be measured and the other having a value corresponding to another possible resistance value of the resistance to be measured. The combined discharge characteristics of the pair of second capacitors, e.g. an average of the discharge capacitor voltage, is compared with the discharge characteristics e.g. the discharge voltage of the first capacitor to determine a value of the resistance to be measured relative to an average value of the two reference resistances.

BRIEF DESCRIPTION OF THE DRAWINGS

The foregoing and other features and advantages of the invention will become more apparent from the detailed description of the exemplary embodiments of the invention given below with reference to the accompanying drawings in which:

FIG. 1 shows the invention employed in an exemplary MRAM device;

FIG. 2 shows a schematic diagram of one aspect of the invention;

FIG. 3 shows a schematic diagram of an additional aspect of the invention;

FIG. 4 shows the discharge rate characteristics of capacitors employed in the invention;

FIG. 5 shows a schematic diagram of an additional aspect of the invention;

FIG. 6 shows a schematic diagram of an additional aspect of the invention; and

FIG. 7 shows the invention utilized in a computer system.

DETAILED DESCRIPTION OF THE INVENTION

A portion of a MRAM array 100 with which the present invention may be used is shown in FIG. 1. The logical state of an MRAM memory element e.g. 204 is represented by the resistance of that element. In the present invention, resistance is determined by holding a voltage constant across a cell's resistive element and comparing a voltage produced by the current that flows through that resistive element with a voltage produced by the current flow through a known reference resistance. To read the binary state of a memory cell element, the absolute magnitude of resistance need not be known; only whether the resistance is above or below a value that is intermediate to the logic high and logic low values. Accordingly, to provide a reference current flow for comparison purposes the resistive elements within rightmost column 108 of array 100 are preprogrammed to hold all ‘0’ values, while those within column 110 immediately to its left are preprogrammed to hold all ‘1’ values. The current flowing through these two columns when a particular row line of the array 100 is selected by grounding a rowline, e.g. rowline 120, will heretofore be designated as I₀ and I₁, as shown in FIG. 1.

During the reading process, all column and row lines are driven with the same array voltage V_(A), except for the one row line, e.g. 120 that is desired to be read. That row line 120 is driven to ground. When row 120 is grounded, a resistive element of a selected column, e.g. column 109, can be read by a sensing circuit 300 described below As shown in FIG. 1, both ends of all resistive elements not being measured are maintained at the same potential, V_(A). Thus, unwanted current flow through these resistive elements due to “sneak” resistance is negligible. A current I_(sense) flows through the grounded resistive element of a selected column within the row 120 for allowing measurement of the resistance by the sensing circuit 300 (not shown in FIG. 1).

FIG. 2 shows a circuit 200 for regulating current through and voltage across a resistive element 204 being measured. An operational amplifier 220 has one terminal 222 connected to V_(A), while the other terminal 224 is connected to the column line 109 for the resistance element 204 which is being sensed. The gate 242 of NMOS transistor 240 is connected to the output of operational amplifier 220. The source 246 of transistor 240 is connected to one terminal of the resistive element 204 being read, while the other terminal of resistive element 204 is driven to ground by the grounding of wordline 120 described earlier. Operational amplifier 220 and transistor 240 act in concert to keep one terminal of resistive element 204 stably at V_(A) despite the fact that the other terminal is grounded. In this way, I_(sense) can flow through transistor 240 and resistive element 204, while current lost through sneak resistor 225 is minimized.

To sense the amount of resistance of resistance element 204, the current flow through resistance element 204 must be determined, since the voltage across resistance element 204 is held constant at V_(A). FIG. 3 shows how the current regulating circuit 200 combined with a voltage comparator 304, and a reference voltage generating circuit 115 to provide a method and apparatus for determining current flow through sensed resistance element 204. As shown in FIG. 3, the active wordline 120 is also connected to reference resistance elements R0 and R1 associated with column lines 108 and 110, which are pre-set to ‘0’ and ‘1’ resistance values respectively. Each column line of array 110 which has resistance elements which may be written to or read has its own sensing circuit and comparator which are active when the column is addressed to select with the grounded rowline, which resistive memory element within a given row is being read. Thus, connection line 320 shows how the reference voltage generating circuit 115 is connected to other columns of array 100. As noted, each column line (e.g. 109 shown in FIG. 3.) has a voltage having a reference input 113 and sensed voltage input 116.

The reference voltage generating circuit 115 includes a first 202 and second 244 regulating circuit each associated with a respective reference resistance element 108, 110. These regulating circuits respectively hold the voltage across reference resistors elements 108 and 110 at V_(A) in the manner described above with reference to FIG. 2. The resistance elements R₀, R₁ have respective known resistance values corresponding to one of the logic states of a memory element and the other corresponding to the other possible logic state. The reference voltage generating circuit 115 also includes capacitors C₁ and C₀ respectively associated with the reference resistance elements R₀ and R₁. Each of the capacitors C₁ and C₀ has one lower terminal grounded and the other upper terminal connectable to a common voltage line 132 through a respective switch element 134, 136. The switch elements 134, 136 are configured to connect the upper terminals of the capacitors C₁, C₀ to either a source of voltage V_(A) or to the common voltage line 132. The common voltage line 132 is connected to the reference voltage input 113 of comparator 304.

As noted, the comparator 304 also has a voltage input 116. This is connected through another switch element 206 to an upper terminal of a sensing capacitor C_(sense), the lower terminal of which is grounded. Switch element 206 is adapted to connect the upper terminal of comparator C_(sense) to either a source of voltage V_(A) or to the input 116 of comparator 304. The input 116 is also connected to the upper (drain) terminal of transistor 240 which has it's source terminal connected to the resistance element 204, the resistance of which is to be measured.

All of the switch elements 134, 136 and 206 switch together to either connect the upper terminals of capacitors C_(sense), C₁, an C₀ to the voltage VA, or to connect the upper terminal of capacitor C_(sense) to input 116 and the upper terminals of capacitors C₁ and C₀ to common voltage line 132. When the switch elements are in the latter condition the capacitors C_(sense), C₁, and C₀ are connected in a way which provides the current flows I0, I1 and Isense through respective resistance elements R0, R1 and 204.

The circuit of FIG. 3 operates as follows. Capacitors C_(sense), C₁, and C₀ are first fully charged to V_(A) by switch elements 134, 136 206 simultaneously connecting their upper terminals to a V_(A) voltage source. After the capacitors C_(sense), C₁, and C₀ are charged the switch elements 134, 136, and 206 are simultaneously operated to connect the upper terminal of capacitor C_(sense) to input 116 and the upper terminal of capacitors C₀ and C₁ to the common voltage line 132. As a result all three capacitors begin discharging in unison in the direction symbolized by current flow arrows I_(sense), I₁, and I₀. The rate at which the capacitors C₁ and C₀ discharge is determined by the resistance of the path through which they discharge.

The capacitor C_(sense) will also discharge through resistance element 204 and the decaying voltage on capacitor 204 is applied to sense voltage input 116 of comparator 304. The discharge of both capacitors simultaneously will provide a reference voltage on voltage line 132 which is the average voltage instantaneously on capacitors C₁, C₀. Thus, as capacitors C₁ and C₀ discharge, this average voltage will decay. This average voltage is applied to the reference voltage input of comparator 304. The capacitor C_(sense) will discharge significantly faster if resistance element 204 has a resistance representing a ‘0’ value (e.g. 950 KΩ) than a resistance representing a ‘1’ value (e.g. 1 MΩ). Consequently, the voltage on C_(sense) will discharge either more slowly or more quickly than the average voltage discharge of C₁ and C₀, hereafter noted as V_(av). The combined average voltage across capacitors C₁ and C₀ as seen by comparator 304 decays with time as shown by V_(av) in FIG. 4. V _(av) falls between the decaying voltage on capacitor Csense when a logical ‘1’ and a ‘0’ resistance is set in resistance element 204. Because the resistive memory element 204 being sensed will either store a 1 or a 0, its discharge voltage V_(sense) will (intentionally) never be equal to V_(av), instead V_(sense) will always be measurably higher or lower than V_(av). Accordingly, the difference between the sensed and reference discharge voltages (V_(sense) and V_(av)) will be compared by the comparator 304 at sense time t_(sense) which will provide an electrical ‘1’ or ‘0’ output representing the stored logic value of resistance element 204.

Thus, determining whether a resistive memory element holds a ‘1’ or a ‘0’ does not require quantitatively measuring V_(sense) instead, it is only necessary to compare V_(sense) with V_(av) using a comparator 304. A circuit for comparing V_(sense) to V_(av) can be achieved with less components than a circuit for quantitatively measuring V_(sense). The frequency with which the voltages V_(sense) and V_(av) can be compared is limited only by the capacitance values of C₀, C₁, and C_(sense) which must also produce an integrating effect across their respective resistance elements.

FIG. 5 shows an alternative embodiment in which only a single capacitor C_(av) is used in the reference voltage across 115 a. In such an embodiment, the desired V_(av) could be obtained by discharging capacitor C_(av) across a single resistor R_(median) of known value which lies between resistance values corresponding to a logical ‘0’ and ‘1’ value. For example, if 950 KΩ corresponds to a typical MRAM resistance for a binary ‘0’, and 1 MΩ corresponds to the typical MRAM resistance for a binary ‘1’, then a median resistance value is set for example at 975 KΩ. By discharging capacitor C_(av) across such a median resistance, a value for V_(av) for comparison with V_(sense) can be provided. In this embodiment, the R_(median) resistance can be provided by using a single column, e.g. 108, of reference resistance elements in array 100 having this value, or dispensing with reference resistance element in the array in favor of an out-of array reference resistance element which has the R_(median) value.

FIG. 6 illustrates how the current regulating circuit 200 and sensing circuit 300 of the invention are arranged with a memory array 100. In FIG. 6, the columns which connect with storage resistive elements are labeled 107, 109, while the reference columns remain shown in 108, 110.

The sensing circuit 300 of the present invention compares two discharge voltages V_(sense) and V_(av) and immediately makes a determination which logical value to output on bit-out line 330. Thus, a method and apparatus for quickly measuring MRAM values while minimizing the number of necessary components is achieved.

FIG. 7 is a block diagram of a processor-based system 350 utilizing a MRAM array 100 constructed in accordance with one of the embodiments of the present invention. The processor-based system 350 may be a computer system, a process control system or any other system employing a processor and associated memory. The system 350 includes a central processing unit (CPU) 352, e.g., a microprocessor, that communicates with the MRAM array 100 and an I/O device 354 over a bus 356. It must be noted that the bus 356 may be a series of buses and bridges commonly used in a processor-based system, but for convenience purposes only, the bus 356 has been illustrated as a single bus. A second I/O device 306 is illustrated, but is not necessary to practice the invention. The processor-based system 350 also includes read-only memory (ROM) 360 and may include peripheral devices such as a floppy disk drive 362 and a compact disk (CD) ROM drive 364 that also communicates with the CPU 352 over the bus 356 as is well known in the art.

While the invention has been described and illustrated with reference to specific exemplary embodiments, it should be understood that many modifications and substitutions can be made without departing from the spirit and scope of the invention. Accordingly, the invention is not to be considered as limited by the foregoing description but is only limited by the scope of the appended claims. 

1. A sensing circuit for sensing a resistance value of a first resistive element in a memory device, the circuit comprising: a first capacitor and at least one reference capacitor; a charging circuit for charging said first and said at least one reference capacitors to a predetermined voltage value; at least one reference resistive element; a first discharge circuit for discharging said first capacitor through the first resistive element, said first discharge circuit having a first discharge characteristic; a second discharge circuit for discharging said at least one reference capacitor through said reference resistive element, said second discharge circuit having a second discharge characteristic; and a comparison circuit for comparing said first discharge characteristic to said second discharge characteristic.
 2. The sensing circuit of claim 1 wherein said first and second discharge characteristics are voltage levels.
 3. The sensing circuit of claim 2 wherein said at least one reference capacitor comprises first and second reference capacitors and said at least one reference resistive element comprises first and second resistive elements respectively associated with said first and second reference capacitors, wherein said first reference capacitor discharges through said first reference resistive element and said second reference capacitor discharges through said second reference resistive element.
 4. The sensing circuit of claim 3 wherein said first and second reference resistive elements respectively have resistance values corresponding to a binary “1” value and a binary “0” value.
 5. The sensing circuit of claim 1 further comprising a regulation circuit for maintaining a predetermined voltage across said selected resistive element during discharge of said capacitors.
 6. The sensing circuit of claim 5 wherein said regulation circuit comprises a voltage source and a switch for selectively connecting said voltage circuit to said capacitors.
 7. A resistive memory sensing apparatus comprising: means for applying an electrical charge to a plurality of storing means; first discharge means for discharging a first stored electrical charge through a first resistive element according to a first, measurable discharge characteristic, said first resistive element having one of a first or a second programmed resistance; second discharge means for discharging a second stored electrical charge through a reference resistive element, said second discharge means discharging according to a second, predictable discharge characteristic; and means for comparing said first and said second discharge characteristics and for outputting a result based on said comparison.
 8. The resistive memory sensing apparatus of claim 7 wherein the first and second discharge characteristics comprise a rate of decaying voltage on said first and second discharge means respectively.
 9. The resistive memory sensing apparatus of claim 7 wherein said first and second programmed resistances are resistive values corresponding to a binary logic value of “1” and a logic value of “0” respectively.
 10. The resistive memory sensing apparatus of claim 9 wherein said reference resistive element has a reference resistance value of between a value corresponding to a logical “1” and a value corresponding to a logical “0.”
 11. The resistive memory sensing apparatus of claim 7 wherein said second discharge means comprises first and second reference capacitive structures, and said reference resistive element comprises first and second reference resistance elements corresponding to and associated with a respective one of said first and second reference capacitive structures.
 12. The resistive memory sensing apparatus of claim 11 wherein said first reference resistance element has a resistance value approximately equal to a value corresponding to a logical “1” value and wherein said second reference resistance element has a resistance value approximately equal to a value corresponding to a logical “0” value.
 13. The resistive memory sensing apparatus of claim 7 further comprising a switch means for selectively connecting said applying means to selective ones of said plurality of storing means.
 14. A method for converting a resistance into a logic state signal, said method comprising: charging a first capacitor and at least one reference capacitor; discharging the first capacitor through a first resistance element; discharging the at least one reference capacitor through at least one reference resistance element; sensing a first discharge characteristic of said first capacitor and a second discharge characteristic of said at least one reference capacitor; comparing said first and second discharge characteristics; and outputting a logic signal based on said comparison.
 15. The method of claim 14 wherein said charging steps comprise connecting each capacitor to a common voltage source having a predetermined voltage level.
 16. The method of claim 14 wherein said step of sensing a first and second discharge characteristic comprises taking a quantitative measurement of at least one of voltage and current.
 17. The method of claim 14 wherein said sensing said second discharge characteristic of said at least one reference capacitor comprises sensing a discharge characteristic of a first reference capacitor and sensing a discharge characteristic of a second reference capacitor and averaging said discharge characteristics.
 18. A method of reading a logic state from a resistance memory device comprising: connecting a first resistance element to a first capacitive element to form a resistance memory device; connecting said resistance memory device to a reference circuit, said reference circuit comprising at least one second capacitive element connected to at least one second resistance element, said second resistance element having a known resistance value; charging said first and at least one second capacitive elements to a predetermined state; simultaneously discharging said first and at least second capacitive elements respectively through said first and at least one second resistance elements; quantitatively measuring a discharge characteristic from each capacitive element; comparing said quantitative measurements from said first and said at least one second capacitive elements; and outputting a value representing said comparison.
 19. The method of claim 18 wherein said step of charging said first and at least one second capacitive elements comprises applying a reference voltage to each capacitive element.
 20. The method of claim 18 wherein said step of quantitatively measuring a discharge characteristic comprises measuring a rate of voltage decay at each of said first and at least one second capacitive elements.
 21. The method of claim 18 wherein said step of comparing said quantitative measurements from said first and said at least one second capacitive elements comprises inputting an output of said first resistance element and an output of said reference circuit into a comparator. 